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1

SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Microlithography - Santa Clara, CA (Sunday 10 March 1996)] Optical Microlithography IX - Fabrication of 1D gratings on photoresist for light-scattering and memory-effect measurements

Gu, Zu-Han, Josse, Michel A., Fuller, Gene E.

Year:

1996

Language:

english

File:

PDF, 181 KB

english, 1996

2

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III - Interferometry for wafer dimensional metrology

Freischlad, Klaus, Tang, Shouhong, Grenfell, Jim, Duparré, Angela, Singh, Bhanwar, Gu, Zu-Han

Year:

2007

Language:

english

File:

PDF, 861 KB

english, 2007

3

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Rough Surface Scattering and Contamination - Consequences of atomic oxygen interaction with silicone and silicone contamination on surfaces in low earth orbit

Banks, Bruce A., de Groh, Kim K., Miller, Sharon K., Haytas, Christy A., Chen, Philip T. C., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1999

Language:

english

File:

PDF, 2.87 MB

english, 1999

4

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Rough Surface Scattering and Contamination - Spray cleaning with hydrofluorocarbon solutions

Kaiser, Robert, Miller, Ryan S., Cardin, Jeremy T., Chen, Philip T. C., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1999

Language:

english

File:

PDF, 504 KB

english, 1999

5

Optical Implementation Of The Hotelling Trace Criterion For Image Classification

Journal:

Optical Engineering

Year:

1984

Language:

english

File:

PDF, 4.11 MB

english, 1984

6

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Surface Scattering and Diffraction for Advanced Metrology - Fabrication of one-dimensional random surfaces that display enhanced backscattering for only one specified angle of incidence

Ciftan, Mikael, Leskova, Tamara A., Maradudin, Alexei A., Gu, Zu-Han, Maradudin, Alexei A.

Year:

2001

Language:

english

File:

PDF, 175 KB

english, 2001

7

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Reflection, Scattering, and Diffraction from Surfaces II - A model for the optical properties of amorphous carbon (soot)

Thomas, Michael E., Gu, Zu-Han, Hanssen, Leonard M., Freund, David E., Joseph, Richard I.

Year:

2010

Language:

english

File:

PDF, 220 KB

english, 2010

8

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, CA (Sunday 31 July 2005)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - Lifetime estimation of InGaAlP lasers under different operating conditions

Li, Yajun, Duparr½Á, Angela, Singh, Bhanwar, Gu, Zu-Han

Year:

2005

Language:

english

File:

PDF, 1.23 MB

english, 2005

9

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Rough Surface Scattering and Contamination - High-temperature attempts using real-time two-color laser speckle-shift strain-measurement system

Tuma, Meg L., Greer III, Lawrence C., Oberle, Lawrence G., Turkuc, Wendy, Chen, Philip T. C., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1999

Language:

english

File:

PDF, 259 KB

english, 1999

10

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, CA (Sunday 31 July 2005)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - Vibration measurement of MEMS by digital laser microinterferometer

Liu, Sheng, Thomas, Dan, Samala, Praveen R., Yang, Lian X., Duparr½Á, Angela, Singh, Bhanwar, Gu, Zu-Han

Year:

2005

Language:

english

File:

PDF, 792 KB

english, 2005

11

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Rough Surface Scattering and Contamination - Predicting temperature increases on the GOES imager and sounder radiant coolers

Sanders, Jr., Jack T., Gorman, Robert R., Woronowicz, Michael S., Chen, Philip T. C., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1999

Language:

english

File:

PDF, 263 KB

english, 1999

12

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Scattering and Surface Roughness III - AFM data analysis: separating surface microtopography from instrumental artifacts

Hueser, Dorothee, Rothe, Hendrik, Gu, Zu-Han, Maradudin, Alexei A.

Year:

2000

Language:

english

File:

PDF, 1.70 MB

english, 2000

13

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - Structural characterisation of semiconductors by computer methods of image analysis

Hernández-Fenollosa, M. A., Duparr½Á, Angela, Singh, Bhanwar, Cuesta-Frau, D., Damonte, L. C., Gu, Zu-Han, Satorre Aznar, M. A.

Year:

2005

Language:

english

File:

PDF, 654 KB

english, 2005

14

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Surface Scattering and Diffraction for Advanced Metrology II - Polarization of scattering by a rough paint surface

Nee, Soe-Mie F., Nee, Tsu-Wei, Gu, Zu-Han, Maradudin, Alexei A.

Year:

2002

Language:

english

File:

PDF, 448 KB

english, 2002

15

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Scattering and Surface Roughness III - Amplified backscattering from dye-doped polymer bounded with 1D rough metal film

Peng, Gang-Ding, Gu, Zu-Han, Gu, Zu-Han, Maradudin, Alexei A.

Year:

2000

Language:

english

File:

PDF, 982 KB

english, 2000

16

Enhanced backscattering of polarized light at vacuum/dielectric interface

Journal:

Optical Engineering

Year:

1995

Language:

english

File:

PDF, 539 KB

english, 1995

17

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Scattering and Surface Roughness II - Scatterometer at Korea Research Institute of Standards and Science (KRISS) for bidirectional reflectance distribution function (BRDF)

Park, Byong Chon, Lee, Yun Woo, O, Beomhoan, Gu, Zu-Han, Maradudin, Alexei A.

Year:

1998

Language:

english

File:

PDF, 829 KB

english, 1998

18

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Rough Surface Scattering and Contamination - Modification of the Maxwell-Beard bidirectional reflectance distribution function

Shemano, Wendy C., Lynn, William F., Shemano, Dave, Davis, Thomas A., Chen, Philip T. C., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1999

Language:

english

File:

PDF, 1.49 MB

english, 1999

19

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Surface Scattering and Diffraction for Advanced Metrology II - Analysis and characterization of surface defects in ophthalmic lenses

Pladellorens, Josep M., Caum, Jesus, Tapias, Montserrat, Cadevall, Cristina, Anto, Joan, Fernandez, Xavier, Gu, Zu-Han, Maradudin, Alexei A.

Year:

2002

Language:

english

File:

PDF, 475 KB

english, 2002

20

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California (Sunday 1 August 2010)] Reflection, Scattering, and Diffraction from Surfaces II - Improvements of nanometer particle's measuring system based on photon correlation spectroscopy

Deng, Shaoyong, Zhang, Qi, Xia, Junying, Xiong, Yan, Guo, Shaofeng, Yang, Yisheng, Gu, Zu-Han, Hanssen, Leonard M.

Year:

2010

Language:

english

File:

PDF, 17.18 MB

english, 2010

21

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Scattering and Surface Roughness III - Light scattering resonances in arbitrarily shaped one-dimensional reentrant surfaces

Negrete-Regagnon, Pedro, Hernandez-Walls, Rafael, Ruiz-Cortes, Victor, Gu, Zu-Han, Maradudin, Alexei A.

Year:

2000

Language:

english

File:

PDF, 4.30 MB

english, 2000

22

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Scattering and Surface Roughness II - BRDF measurements of a new IR black coating with lower reflectance

Smith, Sheldon M., Fleming, John C., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1998

Language:

english

File:

PDF, 798 KB

english, 1998

23

SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Scattering and Surface Roughness - Goniometric optical scatter instrument for bidirectional reflectance distribution function measurements with out-of-plane and polarimetry capabilities

Germer, Thomas A., Asmail, Clara C., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1997

Language:

english

File:

PDF, 390 KB

english, 1997

24

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Scattering and Surface Roughness II - High-frequency approximations of the full wave solutions to single and double scatter cross sections for two-dimensional random rough surfaces

Bahar, Ezekiel, El-Shenawee, Magda, Gu, Zu-Han, Maradudin, Alexei A.

Year:

1998

Language:

english

File:

PDF, 462 KB

english, 1998

25

Interference of a pair of symmetric partially coherent beams

García-Guerrero, E. E., Méndez, E. R., Gu, Zu-Han, Leskova, T. A., Maradudin, A. A.

Journal:

Year:

2010

Language:

english

File:

PDF, 1.44 MB

english, 2010

26

Enhanced backscattering at grazing angles

Gu, Zu-Han, Fuks, I. M., Ciftan, Mikael

Journal:

Year:

2002

Language:

english

File:

PDF, 100 KB

english, 2002

27

SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Scattering and Surface Roughness - Green function for fluorescence from spherical particles located on a substrate

Videen, Gorden W., Hill, Steven C., Pendleton, J. D., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1997

Language:

english

File:

PDF, 261 KB

english, 1997

28

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 10 August 2008)] Reflection, Scattering, and Diffraction from Surfaces - Steel hardness and their optical properties

Suárez-Romero, J. G., Tepichin-Rodríguez, E., Secundino-Palma, E., Hernández-Gómez, E., Gu, Zu-Han, Hanssen, Leonard M.

Year:

2008

Language:

english

File:

PDF, 201 KB

english, 2008

29

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, CA (Sunday 31 July 2005)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - Automated three-axis gonioreflectometer for computer graphics applications

Li, Hongsong, Foo, Sing C., Torrance, Kenneth E., Westin, Stephen H., Duparr½Á, Angela, Singh, Bhanwar, Gu, Zu-Han

Year:

2005

Language:

english

File:

PDF, 1.35 MB

english, 2005

30

SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Scattering and Surface Roughness - Phenomenological BRDF modeling for engineering applications

Jafolla, James C., Stokes, Jeffrey A., Sullivan, Robert J., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1997

Language:

english

File:

PDF, 786 KB

english, 1997

31

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Reflection, Scattering, and Diffraction from Surfaces - NIR reflectance method to determine moisture content in food products

Gu, Zu-Han, Kandala, C. V. K., Konda Naganathan, G., Hanssen, Leonard M., Subbiah, J.

Year:

2008

Language:

english

File:

PDF, 313 KB

english, 2008

32

SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Scattering and Surface Roughness - Scattering by randomly rough two-dimensional dielectric surfaces

Chaikina, Elena I., Hernandez-Walls, Rafael, Mendez, Eugenio R., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1997

Language:

english

File:

PDF, 267 KB

english, 1997

33

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Reflection, Scattering, and Diffraction from Surfaces - Scattering depolarization by a bio-medium with anisotropic bio-molecules

Gu, Zu-Han, Nee, Tsu-Wei, Foeng Nee, Soe-Mie, Hanssen, Leonard M.

Year:

2008

Language:

english

File:

PDF, 275 KB

english, 2008

34

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Scattering and Surface Roughness II - Novel statistical calibration method for laser scanners

Chen, Jerry X., Yen, Yung-Tsai C., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1998

Language:

english

File:

PDF, 391 KB

english, 1998

35

SPIE Proceedings [SPIE Aerospace Sensing - Orlando, FL (Monday 20 April 1992)] Automatic Object Recognition II - Ladar signature simulation

Estep, Jeffrey A., Gu, Zu-Han, Sadjadi, Firooz A.

Year:

1992

Language:

english

File:

PDF, 611 KB

english, 1992

36

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Reflection, Scattering, and Diffraction from Surfaces II - Experimental confirmation of the Rayleigh-Rice obliquity factor

Stover, John C., Gu, Zu-Han, Hanssen, Leonard M.

Year:

2010

Language:

english

File:

PDF, 1.41 MB

english, 2010

37

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Surface Scattering and Diffraction for Advanced Metrology II - High-order correlation from rough surface scattering

Gu, Zu-Han, Gu, Zu-Han, Maradudin, Alexei A.

Year:

2002

Language:

english

File:

PDF, 200 KB

english, 2002

38

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - In-line characterization of silicon nano-crystals grown on high-K tunnel dielectrics

Nolot, E., Duparr½Á, Angela, Singh, Bhanwar, Mur, P., Favier, S., Gu, Zu-Han

Year:

2005

Language:

english

File:

PDF, 586 KB

english, 2005

39

SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Scattering and Surface Roughness - Toward a model accounting for the impact of surface treatment on the performances of scintillation counters

Moisan, Christian, Levin, Anthony, Laman, H., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1997

Language:

english

File:

PDF, 533 KB

english, 1997

40

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - Uncertainties in aspheric profile measurements with the geometry measuring machine at NIST

Griesmann, Ulf, Duparr½Á, Angela, Singh, Bhanwar, Machkour-Deshayes, Nadia, Soons, Johannes, Gu, Zu-Han, Kim, Byoung C., Wang, Quandou, Stoup, John R., Assoufid, Lahsen

Year:

2005

Language:

english

File:

PDF, 767 KB

english, 2005

41

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - Sub-pixel spatial resolution micro-roughness measurements with interlaced stitching

Mooney, James T., Duparr½Á, Angela, Singh, Bhanwar, Stahl, H. Philip, Gu, Zu-Han

Year:

2005

Language:

english

File:

PDF, 156 KB

english, 2005

42

Vortex-lines motion for the Ginzburg-Landau equation with impurity

Journal:

Science China Mathematics

Year:

2007

Language:

english

File:

PDF, 345 KB

english, 2007

43

Coherent effects in the scattering of light from random surfaces with symmetry

Méndez, E. R., Ponce, M. A., Ruiz-Cortés, V., Zu-Han, Zu-Han

Journal:

Year:

1991

Language:

english

File:

PDF, 573 KB

english, 1991

44

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III - Generation of partially coherent light in rough surface scattering and suppression of the speckle it produces

Leskova, T. A., Maradudin, A. A., Méndez, E. R., Wang, Anting, Gu, Zu-Han, Duparré, Angela, Singh, Bhanwar, Gu, Zu-Han

Year:

2007

Language:

english

File:

PDF, 3.54 MB

english, 2007

45

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Surface Scattering and Diffraction for Advanced Metrology II - Advanced system model for 1574-nm imaging, scannerless, eye-safe laser radar

Schael, Ulrich, Rothe, Hendrik, Gu, Zu-Han, Maradudin, Alexei A.

Year:

2002

Language:

english

File:

PDF, 212 KB

english, 2002

46

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Surface Scattering and Diffraction for Advanced Metrology - Enhanced backscattering at grazing angle

Gu, Zu-Han, Ciftan, Mikael, Gu, Zu-Han, Maradudin, Alexei A.

Year:

2001

Language:

english

File:

PDF, 139 KB

english, 2001

47

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Reflection, Scattering, and Diffraction from Surfaces II - Restoration of scene information reflected from a non-specular surface

Hoelscher, Mark G., Gu, Zu-Han, Hanssen, Leonard M., Marciniak, Michael A.

Year:

2010

Language:

english

File:

PDF, 3.09 MB

english, 2010

48

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Scattering and Surface Roughness II - INTEGRAL's Optical Monitoring Camera stray-light design

Mazy, Emmanuel, Defise, Jean-Marc, Plesseria, J.-Y., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1998

Language:

english

File:

PDF, 984 KB

english, 1998

49

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Rough Surface Scattering and Contamination - Application of surface-enhanced Raman scattering spectroscopy to the study of insect virus virion

Bao, PeiDi, Liu, XinMing, Huang, TianQuan, Jiang, Bing, Wu, GuoFeng, Chen, Philip T. C., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1999

Language:

english

File:

PDF, 189 KB

english, 1999

50

SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Scattering and Surface Roughness - Scattering from planar surfaces with magnetic and thermal fluctuations

Lehman, Mario M., Gu, Zu-Han, Maradudin, Alexei A.

Year:

1997

Language:

english

File:

PDF, 316 KB

english, 1997

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